Testing and Design are integrated in today’s technology to reduce the cost of manufacturing by reducing the number of defected products. This course is about testing VLSI circuits at the gate and transistor level designs. Principles of testing are discussed and test generation algorithms are explained. At the hardware level, Built-In-Self test techniques are explained for gate-level designs, and different testing techniques are discussed for transistor-level circuits. The main goal of this course is to design better testable VLSI circuits. Lect: 3 hrs./Lab: 1 hr. Prerequisite: ELE 704 or ELE 734 Course Weight: 1.00 Billing Units: 1
